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Open Access#12018

Strain Tuning of the Anisotropy in the Optoelectronic Properties of TiS3

BASE

Open Access#22020

Electronic System of Counteraction to Laser Means of Location and Destruction ; Електронна система протидії лазерним засобам локації та ураження

BASE

Open Access#32020

Electronic System of Counteraction to Laser Means of Location and Destruction ; Електронна система протидії лазерним засобам локації та ураження

BASE

Open Access#42020

Electronic System of Counteraction to Laser Means of Location and Destruction ; Електронна система протидії лазерним засобам локації та ураження

BASE

Open Access#52021

Enhancement of phase stability and optoelectronic performance of BiFeO3 thin films via cation co-substitution

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Open Access#62021

One-year overview of the H2020 European project DROP-IT

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Open Access#72020

Multifunctional light beam control device by stimuli-responsive liquid crystal micro-grating structures

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Aufsatz(elektronisch)#831. März 2020

Problems of adjusting a filtering gas mask during its prolonged use

In: Bulletin of the Military University of Technology, Band 69, Heft 1, S. 67-88

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Open Access#92022

INVESTIGATION OF UNMASKING SIGNS OF OPTICAL SURVEILLANCE DEVICES ; ДОСЛІДЖЕННЯ ДЕМАСКУЮЧИХ ОЗНАК ОПТИЧНИХ ПРИЛАДІВ СПОСТЕРЕЖЕННЯ

BASE

Open Access#102021

On the effect of copper as wetting agent during growth of thin silver films on silicon dioxide substrates

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Open Access#112017

Spin injection and helicity control of surface spin photocurrent in a three dimensional topological insulator

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Open Access#122016

Mg(OH)2-WS2 van der Waals heterobilayer: Electric field tunable band-gap crossover

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Open Access#132020

Low-Cost, High-Performance Spray Pyrolysis-Grown Amorphous Zinc Tin Oxide: The Challenge of a Complex Growth Process

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Open Access#142015

Singular Temperatures Connected to Charge Transport Mechanism Transitions in Perylene Bisimides from Steady-State Photocurrent Measurements

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Open Access#152017

To a question of opto-electronic methods for examining prints for customs purposes ; К вопросу об оптико-электронных методах исследования эстампов для таможенных целей

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