Domain structure imaging in PMN-PT crystals using channelling-contrast backscattered electron microscopy
We demonstrate the abilities of various SEM techniques for domain imaging in PMN-PT crystals with different compositions. It is shown that the imaging of the chemically etched relief is limited by its destructivity and potential contrast - by low resolution and contrast instability. The optimal parameters of the imaging by backscattered electron channelling allow obtaining the high-resolution domain imaging in PMN-PT crystals. The domain structure change as a result of the phase transition are imaged. The correlation between the images of the surface domain structure obtained by scanning electron microscopy and piezoresponse force microscopy is demonstrated. © 2018 Institute of Physics Publishing. All rights reserved. ; The equipment of the Ural Centre for Shared Use "Modern Nanotechnology" Ural Federal University has been used. The research was made possible by RFBR (grant 17-52-80116-BRICS_a) and state task of Ministry of education and science of the Russian Federation (No. 3.4993.2017/6.7). The work was partially supported by Government of the Russian Federation (Act 211, Agreement 02.A03.21.0006). ; et al.;NT-MDT Spectrum Instruments;Ostec-ArtTool Ltd.;Promenergolab LLC;Russian Foundation for Basic Research;Taylor and Francis Group