High-Temperature X-Ray Diffraction and Fluorescence Spectra of SnSe Single Crystal
In: Proceedings of the Latvian Academy of Sciences. Section B. Natural, Exact, and Applied Sciences., Band 73, Heft 6, S. 519-524
ISSN: 1407-009X
Abstract
The temperature dependence of unit cell parameters was studied using high-temperature X-ray diffraction and the coefficient of thermal expansion of SnSe single crystal was determined. Fluorescence spectra of SnSe single crystal grown by the Bridgman-Stockbarger method were examined using a Cary Eclipse spectrophotometer at room temperature in the wavelength range 200–900 nm. When the samples were irradiated by a pulse at a wavelength of 230 nm, the fluorescence spectra exhibited maxima at wavelengths 313.07, 423.03, 458.93, 495.07, and 530.00 nm.