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2132 2142 26 10 ; S ; © 2018 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. [EN] Currently, faults suffered by SRAM memory systems have increased due to the aggressive CMOS integration density. Thus, the probability of occurrence of single-cell upsets (SCUs) or multiple-cell upsets (MCUs) augments. One of the main causes of MCUs in space applications is cosmic radiation. A common solution is the use of error correction codes (ECCs). Nevertheless, when using ECCs in space applications, they must achieve a good balance between error coverage and redundancy, and their encoding/decoding circuits must be efficient in terms of area, power, and delay. Different codes have been proposed to tolerate MCUs. For instance, Matrix codes use Hamming codes and parity checks in a bi-dimensional layout to correct and detect some patterns of MCUs. Recently presented, column¿line¿code (CLC) has been designed to tolerate MCUs in space applications. CLC is a modified Matrix code, based on extended Hamming codes and parity checks. Nevertheless, a common property of these codes is the high redundancy introduced. In this paper, we present a series of new lowredundant ECCs able to correct MCUs with reduced area, power, and delay overheads. Also, these new codes maintain, or even improve, memory error coverage with respect to Matrix and CLC codes. This work was supported by the Spanish Government under the research Project TIN2016-81075-R. Gracia-Morán, J.; Saiz-Adalid, L.; Gil Tomás, DA.; Gil, P. (2018). Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 26(10):2132-2142. https://doi.org/10.1109/TVLSI.2018.2837220

371 384 18 4 ; OJS ; [EN] This work presents a modular DC-DC converter modeling based on the input-series-output-series connection of two cells using dual active bridge converters. This configuration is interesting in applications in which both ports of the converter must withstand medium to high voltages. From the waveform analysis of the main electrical variables, the averaged equations are obtained to describe the large-signal dynamics of the converter. The averaged model is linearized around an operating point of the converter, obtaining two sets of equations from which the influence of each parameter on the static and dynamic behavior of the converter is analyzed. The results allow the models obtained in the time domain to be validated, both in steady-state and transient conditions, in the full power range of the converter. Bottion, A.J.B., Barbi, I., 2015. Input-series and output-series connected modular output capacitor full-bridge PWM DC-DC converter. IEEE Trans. Ind. Electron. 62, 6213-6221. https://doi.org/10.1109/TIE.2015.2424204 Briz, F., Lopez, M., Rodriguez, A., Arias, M., 2016. Modular power electronic transformers: modular multilevel converter versus cascaded H-bridge solutions. IEEE Ind. Electron. Mag. 10, 6-19. https://doi.org/10.1109/MIE.2016.2611648 Chen, W., Ruan, X., Yan, H., Tse, C.K., 2009. DC/DC conversion systems consisting of multiple converter modules: stability, control, and experimental verifications. IEEE Trans. Power Electron. 24, 1463-1474. https://doi.org/10.1109/TPEL.2009.2012406 De Doncker, R.W.A.A., Divan, D.M., Kheraluwala, M.H., 1991. A three-phase soft-switched high-power-density DC/DC converter for high-power applications. IEEE Trans. Ind. Appl. 27, 63-73. https://doi.org/10.1109/28.67533 Hou, N., Li, Y.W., 2019. A tunable power sharing control scheme for the output-series DAB DC-DC system with independent or common input terminals. IEEE Trans. Power Electron. 34, 9386-9391. https://doi.org/10.1109/TPEL.2019.2911059 Huang, Y., Tse, C.K., Ruan, X., 2009. General control ...

La imprecisión lingüística es una de las razones principales por las que es necesario interpretar las disposiciones legales. Son causas de imprecisión del lenguaje legislativo la vaguedad, la ambigüedad semántica, la ambigüedad pragmática y algunas otras, como la redundancia, la repetición, la infraespecificación, la inconsistencia y las anomalías. Todas ellas están presentes en el artículo 18 de la Ley 40/2015, de 1 de octubre, de Régimen Jurídico del Sector Público. El trabajo analiza la imprecisión lingüística de las leyes con una clasificación de problemas sistemática que toma este artículo como caso de estudio ; Linguistic imprecision is one of the main reasons why interpreting statutes is necessary. Causes or imprecision of statutory language are vagueness, semantic ambiguity, pragmatic ambiguity and some others, such as redundancy, repetition, infraspecification, inconsistence and anomalies. All of them are present in section 18 of the Spanish Act on the legal status of the public sector, of 1 October 2015 [Ley 40/2015, de 1 de octubre, de Régimen Jurídico del Sector Público]. The paper analyses the linguistic imprecision of statutes with a systematic classification of problems which takes that section 18 as a study case ; Este trabajo forma parte del proyecto DER2013-47662-C2-2-R financiado por el MINECO y FEDER ; SI