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A characterization of t/s-diagnosability and sequential t-diagnosability in designs

Lee, Joo-Kang; Butler, Jon T

Open Access

Abstract

This publication is a work of the U.S. Government as defined in Title 17, United States Code, Section 101. As such, it is in the public domain, and under the provisions of Title 17, United States Code, Section 105, may not be copyrighted. ; IEEE Transactions on Computers, C-39, October 1990, pp. 1298-1304 ; A multiprocessing system is t/s diagnosable if all faulty processors can be identified to within s processors provided there are no more than t faculty processors. A characterization theorem of Karunanithi and Medman for t/s diagnosability in certain special cases of systems called designs is extended to the entire class of D designs. We show that for large.

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